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Team-nanotec
Probe tip characterizers
I2FSR - Improved Flared Silicon Ridge
I2FSR - Improved Flared Silicon Ridge
I2FSR
Line with sharp, overhanging edges.
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规格
I2FSR - Improved Flared Silicon Ridge
Line with sharp, overhanging edges.
Specifications
Material
Silicon coated with Siliconnitride
Width of line
~ 2 µm
Depth of line
> 4 µm
Overhang
> 250 nm
Overhang slope angle
~ 35°
Top corner radius
< 10 nm
Edge roughness
< 10 nm
Spec.
image/files/tms-IVPS100-PTB%20-%20Improved%20Vertical%20Parallel%20Structure.pdf
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