CRM for the Calibration of Nano Step-height KRC-NSC-100

KRC-NSC-100
Pattern height: 100 nm Pattern pitch: 3, 5, 10 um

Overview of KRC-NSC-100

  • Nano Step-height Calibrator (NSC) is a CRM to calibrate the step height of atomic force microscopes (AFM) by comparing the measured and certified step-height values.
  • A step-height correction factor (fc) can be determined from the ratio of the measured and certified step-height values of the CRM and the step-height of the target nanostructure can be accurately obtained from the step-height correction factor.
  • Specifications of KRC-NSC-100                                                                                         
  • Item Detailed Specifications
    Pattern height 100 nm
    Pattern pitch 3, 5, 10 um
    Specimen size 5 mm x 5 mm
    Pattern size 1 mm x 1 mm
    Defectivity max 1%
    Traceability Si lattice constant measured by TEM: ILAC-MRA, KOLAS
  • Calibration of step-height by KRC-NSC-100                                   Structure of Nano Pattern
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  • AFM Profiles                                                                                     Circular Coupon type product
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  •                              Wafer type product
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