Overview of KRC-NSC-100
| Item | Detailed Specifications |
|---|---|
| Pattern height | 100 nm |
| Pattern pitch | 3, 5, 10 um |
| Specimen size | 5 mm x 5 mm |
| Pattern size | 1 mm x 1 mm |
| Defectivity | max 1% |
| Traceability | Si lattice constant measured by TEM: ILAC-MRA, KOLAS |


Wafer type product