Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. By using wear-resistant sharp diamond probes the tip-sample contact size is well characterized and stays constant during mechanical and electrical measurements leading to more reliable data.
- ▪ Highly doped with boron with a macroscopic resistivity of 0.003 – 0.005 Ohm∙cm.
- ▪ Typical contact resistance of 10 kΩ depending on contact radius (measured on a silver surface).
- ▪ Gold reflex coating on the detector side of the cantilever to enhance reflectivity.
AD-2.8-AS used in topography, SCM, C-AFM, EFM.
AD-40-AS used in topography, SCM, C-AFM, EFM.
AD-450-AS used in nanomechanics, SCM, C-AFM, EFM.
Minimum quantity: 5.
20-pack = 5 % 50-pack = 10 % 100-pack = 20 % 200-pack = 30 %
Probes are always shipped as 5 probes per box.