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AFM 探针
Team-nanotec
Probe tip characterizers
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IVPS100 - Improved Vertical Parallel Structure
IVPS100
Tip width characterizer with an array of 5 lines with vertical, paralell sidewalls (111-crystal planes).
IVPS100A - Improved Vertical Parallel Structure
IVPS100A
Tip width characterizer with an array of 5 lines 100 nm wide and a single line 100 nm wide for larger tips. Sidewalls are vertical and parallel (111-crystal planes).
IVPS100A-PTB - Improved Vertical Parallel Structure
IVPS100A-PTB
Tip width characterizer with an array of 5 lines, line width varying from 50 nm to 130 nm in steps of 20 nm. Designed in collaboration with Physikalisch Technische Bundesanstalt, Braunschweig, Germany.
I2FSR - Improved Flared Silicon Ridge
I2FSR
Line with sharp, overhanging edges.
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