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首页產品介紹 Kims Reference 標準片(Reference Material) Calibration of high magnification High Magnification Calibrator KRC-HMC-100

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AFM 探针
Kims Reference 標準片(Reference Material)
Tapping mode / Non-contact mode
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- VertiSense™ Scanning Thermal Microscopy

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CRM for the calibration of high magnification KRC-HMC-100

KRC-HMC-100: Pattern width: 5 certified widths of 20 nm ~ 80 nm Pattern pitch: 5 certified pitchs of 100 nm ~ 900 nm

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AFM探針｜原子力顯微鏡探針｜ AFM probes