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ElectriAll-In-One

Chromium and platinum coating
Multipurpose AFM Probe with 4 Different Cantilevers

Multipurpose AFM Probe with 4 Different Cantilevers and Platinum Overall Coating

AFM Tip

SHAPE
Rotated
HEIGHT
17 µm (15 - 19 µm)*
SETBACK
15 µm (10 - 20 µm)*
RADIUS
25 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

4 AFM Cantilevers

Cantilever A - Contact Mode
 Beam
 0.2 N/m (0.04 - 0.7 N/m)*
 15 kHz (10 - 20 kHz)*
 500 µm (490 - 510 µm)*
 30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*
Cantilever B - Force Modulation
 Beam
 2.7 N/m (0.4 - 10 N/m)*
 80 kHz (50 - 110 kHz)*
 210 µm (200 - 220 µm)*
 30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*
Cantilever C - Soft Tapping
 Beam
 7.4 N/m (1 - 29 N/m)*
 150 kHz (70 - 230 kHz)*
 150 µm (140 - 160 µm)*
 30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*
Cantilever D - Tapping Mode
 Beam
 40 N/m (7 - 160 N/m)*
 350 kHz (200 - 500 kHz)*
 100 µm (90 - 110 µm)*
 50 µm (45 - 55 µm)*
 2.7 µm (1.7 - 3.7 µm)*
* typical range

Coating

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

Alignment Grooves

none

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the ElectriAll-In-One AFM cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

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