Resonance Frequency (F): 105 kHzSpring Constant (K): 290 N/m
The 25PtIr200B-H is the updated version of RMN’s high frequency probe, with prolonged mechanical wear. It is typically used for non-contact and tapping mode AFM measurements. These probes are ideal for THz-SNOM, SNOM and high Frequency applications.
Tip shank length: 80 μm (± 25%)
Cantilever length: 200 µm (± 15%)
Cantilever width: 50 µm (± 15%)
Spring constant: 290 N/m (± 40%)
Frequency: 105 kHz (± 30%)
Standard tip radii below 20 nm
Tip radii below 10 nm on request (referred to as 25PtIr200B-H10)
Non-standard probe tips and cantilevers upon request
