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All-In-One/-Al

None or aluminum reflective coating
Multipurpose AFM Probe with 4 Different Cantilevers
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Multipurpose AFM Probe with 4 Different Cantilevers and/or Aluminum Reflective Coating

AFM Tip

SHAPE
Rotated
HEIGHT
17 µm (15 - 19 µm)*
SETBACK
15 µm (10 - 20 µm)*
RADIUS
10 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

4 AFM Cantilevers

Cantilever A - Contact Mode
 Beam
 0.2 N/m (0.04 - 0.7 N/m)*
 15 kHz (10 - 20 kHz)*
 500 µm (490 - 510 µm)*
 30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*
Cantilever B - Force Modulation
 Beam
 2.7 N/m (0.4 - 10 N/m)*
 80 kHz (50 - 110 kHz)*
 210 µm (200 - 220 µm)*
 30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*
Cantilever C - Soft Tapping
 Beam
 7.4 N/m (1 - 29 N/m)*
 150 kHz (70 - 230 kHz)*
 150 µm (140 - 160 µm)*
 30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*
Cantilever D - Tapping Mode
 Beam
 40 N/m (7 - 160 N/m)*
 350 kHz (200 - 500 kHz)*
 100 µm (90 - 110 µm)*
 50 µm (45 - 55 µm)*
 2.7 µm (1.7 - 3.7 µm)*
* typical range

Coating

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Alignment Grooves

none

Additional Info

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You do not need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One AFM cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

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