Contact Mode AFM Probe with Platinum Overall Coating
AFM Tip
SHAPE
Rotated
HEIGHT
17 µm (15 - 19 µm)*
SETBACK
15 µm (10 - 20 µm)*
RADIUS
25 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
AFM Cantilever
Cantilever A
Beam
0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
2 µm (1 - 3 µm)*
* typical range
Coating
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
Alignment Grooves
This product features alignment grooves on the back side of the holder chip.
