Home Products AFM PROBES MikroMasch HQ Series NSC14/AL BS

NSC14/AL BS

Detector aluminum coating
Resonance Frequency (F): 160 kHz Spring Constant (K): 5 N/m

Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

  • Typical probe tip radius of uncoated tip: 8nm
  • Full tip cone angle: 40°
  • Total tip height: 12 - 18 µm
  • Probe material: n-type Silicon
  • Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
  • Detector coating: Aluminum

CANTILEVER

SEM image of tetrahedral tip cantilever (OMCL-AC160TS-)

SEM image of the cantilever

SEM image of tetrahedral tip cantilever (OMCL-AC160TS-)

Schematic drawing of the cantilever

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,		 Width
w ± 3,		 Thickness
t ± 0.5,
  min typ max min typ max µm µm µm
14 Series 110 160 220 1.8 5 13 125 25 2.1

*The full cone angle may be less than 40° at the last 200 nm of the tip end.

SEM image of tetrahedral tip cantilever (OMCL-AC160TS-)

Polymer Spherulite on Mica. 10 µm topography scan. Image obtained on Smart SPM ( AIST-NT Inc, Novato, CA).

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